X-ray diffraction
- Texture & Stress diffractometer AXS BRUKER D8 incl. VANTEC 500 area detector and polycapillary
- Profile Analysis (XPA) diffractometer with
- Rotating anode generator RIGAKU MM9 with monochromatisation Co-Kalpha
- Curved Position Sensitive Detector INEL CPS-590
- 4 Linear Position Sensitive Detectors (BRAUN, Photron-X)
Contact: Erhard Schafler
Location: Boltzmanngasse 5, 3K02
Phone: +43-1-4277-72884