Advanced new techniques including 4D-STEM electron ptychography allow accessing material properties beyond the location of the atomic nuclei. In addition, computer control allows automated imaging leading to an unbiased understanding of the imaged materials at mesoscopic length scales, enabled by machine-learning-based image analysis.
PIs: Jani Kotakoski; Toma Susi
Projects:
Publications:
- Schloz et al., Sci. Rep. 13, 8732 (2023)
- Trentino et al., Nano Lett. 21, 5179-5185 (2021)
- Zachmann et al., Small 17 (28), 2100388 (2021)