Visualising the strain distribution in suspended two-dimensional materials under local deformation
- Author(s)
- Kenan Elibol, Bernhard C. Bayer, Stefan Hummel, Jani Kotakoski, Giacomo Argentero, Jannik C. Meyer
- Abstract
We demonstrate the use of combined simultaneous atomic force microscopy (AFM) and laterally resolved Raman spectroscopy to study the strain distribution around highly localised deformations in suspended two-dimensional materials. Using the AFM tip as a nanoindentation probe, we induce localised strain in suspended few-layer graphene, which we adopt as a two-dimensional membrane model system. Concurrently, we visualise the strain distribution under and around the AFM tip in situ using hyperspectral Raman mapping via the strain-dependent frequency shifts of the few-layer graphene's G and 2D Raman bands. Thereby we show how the contact of the nm-sized scanning probe tip results in a two-dimensional strain field with mu m dimensions in the suspended membrane. Our combined AFM/Raman approach thus adds to the critically required instrumental toolbox towards nanoscale strain engineering of two-dimensional materials.
- Organisation(s)
- Physics of Nanostructured Materials
- Journal
- Scientific Reports
- Volume
- 6
- No. of pages
- 9
- ISSN
- 2045-2322
- DOI
- https://doi.org/10.1038/srep28485
- Publication date
- 06-2016
- Peer reviewed
- Yes
- Austrian Fields of Science 2012
- 103018 Materials physics
- Keywords
- Portal url
- https://ucrisportal.univie.ac.at/en/publications/visualising-the-strain-distribution-in-suspended-twodimensional-materials-under-local-deformation(fd2984b2-0e45-4932-8ee1-f344dbd7906b).html