Mechanism of nanostructure formation in ball-milled Cu and Cu-3wt% Zn studied by X-ray diffraction line profile analysis

Author(s)
M. Samadi Khoshkhoo, S. Scudino, J. Bednarcik, A. Kauffmann, H. Bahmanpour, J. Freudenberger, R. Scattergood, M. J. Zehetbauer, C. C. Koch, J. Eckert
Abstract

The mechanism of nanostructure formation during cryogenic and

room-temperature milling of Cu and Cu–3wt%Zn was investigated using

X-ray diffraction line profile analysis. For that, the whole powder

pattern modeling approach (WPPM) was used to analyze the evolution of

microstructural features including coherently scattering domain size,

dislocation density, and density of planar faults. It was found that for

all sets of experiments, structural decomposition is the dominant

mechanism of nanostructure formation during cryomilling. During

subsequent RT-milling, grain refinement still occurs by structural

decomposition for pure copper. On the other hand, discontinuous dynamic

recrystallization is responsible for nanostructure formation during

RT-milling of Cu–3wt%Zn. This is attributed to lower stacking-fault

energy of Cu–3wt%Zn compared to pure copper. Finally, room temperature

milling reveals the occurrence of a detwinning phenomenon.

Organisation(s)
Physics of Nanostructured Materials
External organisation(s)
Leibniz-Institut für Festkörper- und Werkstoffforschung Dresden, Technische Universität Dresden, North Carolina State University, Deutsches Elektronen-Synchrotron DESY, University of California, Davis, Technische Universität Bergakademie Freiberg
Journal
Journal of Alloys and Compounds
Volume
588
Pages
138-143
No. of pages
6
ISSN
0925-8388
DOI
https://doi.org/10.1016/j.jallcom.2013.10.252
Publication date
03-2014
Peer reviewed
Yes
Austrian Fields of Science 2012
103018 Materials physics
Keywords
ASJC Scopus subject areas
Mechanics of Materials, Mechanical Engineering, Metals and Alloys, Materials Chemistry
Portal url
https://ucrisportal.univie.ac.at/en/publications/mechanism-of-nanostructure-formation-in-ballmilled-cu-and-cu3wt-zn-studied-by-xray-diffraction-line-profile-analysis(d978fe14-cba0-4b4f-be1a-7bc9f08997df).html