Experimental and analytical study of geometry effects on the fatigue life of Al bond wire interconnects
- Author(s)
- Bernhard Czerny, I. Paul, G. Khatibi, M. Thoben
- Organisation(s)
- Physics of Nanostructured Materials
- External organisation(s)
- Infineon Technologies AG
- Journal
- Microelectronics Reliability
- Volume
- 53
- Pages
- 1558-1562
- No. of pages
- 5
- ISSN
- 0026-2714
- DOI
- https://doi.org/10.1016/j.microrel.2013.07.090
- Publication date
- 09-2013
- Peer reviewed
- Yes
- Austrian Fields of Science 2012
- 202025 Power electronics, 103018 Materials physics, 201108 Fracture mechanics
- Portal url
- https://ucrisportal.univie.ac.at/en/publications/60896672-4502-41c8-96cf-227a3e3a67ab