Advances in microstructural investigation using the REM-ECC-imaging technique
- Author(s)
- C Stickler, Dana Melisova, Bernhard Mingler, Brigitte Weiss, Roland Stickler
- Abstract
With the improvements made in Scanning Electron Microscopy (SEM) it is now possible, using the Electron-Channelling-Contrast-Imaging (ECCI) technique, to image the global arrangement of dislocations in metallic materials. This type of investigation is complementary to imaging by diffraction contrast in the Transmission Electron Microscope (TEM) and in comparison requires less specimen preparation. Using the ECCI-technique, it is possible to examine almost the whole of the electro-polished surface of a solid specimen of magnifications of up to 10,000 times. In addition, using Selected-Area-Channelling-Diagrams (SACP), the orientation of areas of the specimen less than 30 œm in diameter can be determined. In doing this, there is no requirement to tilt the specimen, the orientation being related directly to the ECC-image. Following a short description of the SEM-ECC imaging process, its possible uses are illustrated with reference to actual practical examples.
- Organisation(s)
- Physics of Nanostructured Materials
- External organisation(s)
- Universität Wien
- Journal
- Praktische Metallographie = Practical metallography
- Volume
- 38
- Pages
- 19-30
- No. of pages
- 12
- ISSN
- 0032-678X
- Publication date
- 2001
- Peer reviewed
- Yes
- Austrian Fields of Science 2012
- 104017 Physical chemistry
- Portal url
- https://ucris.univie.ac.at/portal/en/publications/advances-in-microstructural-investigation-using-the-remeccimaging-technique(e5473462-0493-4932-8455-be6b5accb203).html