In-Situ Synchrotron Profile Analysis after High-Pressure Torsion Deformation

Author(s)
Michael Kerber, Florian Spieckermann, Roman Schuster, Bertalan Joni, Norbert Schell, Erhard Schafler
Organisation(s)
Physics of Nanostructured Materials, Department of Lithospheric Research
Journal
Crystals - Open Access Crystallography Journal
Volume
9
No. of pages
12
ISSN
2073-4352
DOI
https://doi.org/10.3390/cryst9050232
Publication date
05-2019
Publication status
Published
Peer reviewed
Yes
Austrian Fields of Science 2012
105113 Crystallography, 103018 Materials physics
Keywords
severe plastic deformation, hydrostatic pressure, pressure release, defect mobility, PLASTICALLY DEFORMED-CRYSTALS, HYDROSTATIC-PRESSURE, CONTRAST FACTORS, RAY, MICROSTRUCTURE, DISLOCATIONS, POLYCRYSTALS, PARAMETERS, ANISOTROPY, STRENGTH
Portal url
https://ucris.univie.ac.at/portal/en/publications/insitu-synchrotron-profile-analysis-after-highpressure-torsion-deformation(9ce32699-1c02-42de-9215-8c89b8be5dda).html