High dose efficiency atomic resolution imaging via electron ptychography

Author(s)
Timothy J. Pennycook, Gerardo T. Martinez, Peter D. Nellist, Jannik C. Meyer
Organisation(s)
Physics of Nanostructured Materials
Journal
Ultramicroscopy
Volume
196
Pages
131-135
No. of pages
5
ISSN
0304-3991
DOI
https://doi.org/10.1016/j.ultramic.2018.10.005
Publication date
01-2019
Publication status
Published
Peer reviewed
Yes
Austrian Fields of Science 2012
103042 Electron microscopy
Keywords
STEM, TEM, Phase contrast, Ptychography, Dose efficiency, INFORMATION LIMIT, PHASE PLATE, DIFFRACTION, MICROSCOPY
Portal url
https://ucris.univie.ac.at/portal/en/publications/high-dose-efficiency-atomic-resolution-imaging-via-electron-ptychography(93280db9-7e2a-45b5-93d4-697f33d010b5).html