High dose efficiency atomic resolution imaging via electron ptychography

Author(s)
Timothy J. Pennycook, Gerardo T. Martinez, Peter D. Nellist, Jannik C. Meyer
Abstract

Radiation damage places a fundamental limitation on the ability of microscopy to resolve many types of materials at high resolution. Here we evaluate the dose efficiency of phase contrast imaging with electron ptychography. The method is found to be far more resilient to temporal incoherence than conventional and spherical aberration optimized phase contrast imaging, resulting in significantly greater clarity at a given dose. This robustness is explained by the presence of achromatic lines in the four dimensional ptychographic dataset.

Organisation(s)
Physics of Nanostructured Materials
External organisation(s)
Max-Planck-Institut für Festkörperforschung, University of Oxford
Journal
Ultramicroscopy
Volume
196
Pages
131-135
No. of pages
5
ISSN
0304-3991
DOI
https://doi.org/10.1016/j.ultramic.2018.10.005
Publication date
01-2019
Peer reviewed
Yes
Austrian Fields of Science 2012
Electron microscopy
Keywords
Portal url
https://ucris.univie.ac.at/portal/en/publications/high-dose-efficiency-atomic-resolution-imaging-via-electron-ptychography(93280db9-7e2a-45b5-93d4-697f33d010b5).html