Correlation between the microstructure studied by X-ray line profile analysis and the strength of high-pressure-torsion processed Nb and Ta
- Author(s)
- B. Jóni, Erhard Schafler, Michael Zehetbauer, G Tichy, Tamas Ungar
- Organisation(s)
- Physics of Nanostructured Materials
- External organisation(s)
- Eötvös Loránd University Budapest
- Journal
- Acta Materialia
- Volume
- 61
- Pages
- 632-642
- No. of pages
- 11
- ISSN
- 1359-6454
- DOI
- https://doi.org/10.1016/j.actamat.2012.10.008
- Publication date
- 2013
- Peer reviewed
- Yes
- Austrian Fields of Science 2012
- 1030 Physics, Astronomy, 210006 Nanotechnology, 103018 Materials physics
- Portal url
- https://ucris.univie.ac.at/portal/en/publications/correlation-between-the-microstructure-studied-by-xray-line-profile-analysis-and-the-strength-of-highpressuretorsion-processed-nb-and-ta(8fcda369-031a-4134-9360-c460cd8d85c7).html