Interferometric 4D-STEM for Lattice Distortion and Interlayer Spacing Measurements of Bilayer and Trilayer 2D Materials
- Author(s)
- Michael J. Zachman, Jacob Madsen, Xiang Zhang, Pulickel M. Ajayan, Toma Susi, Miaofang Chi
- Organisation(s)
- Physics of Nanostructured Materials
- External organisation(s)
- Rice University, Oak Ridge National Laboratory
- Journal
- Small
- Volume
- 17
- No. of pages
- 10
- ISSN
- 1613-6810
- Publication date
- 06-2021
- Peer reviewed
- Yes
- Austrian Fields of Science 2012
- 103042 Electron microscopy, 103018 Materials physics, 210004 Nanomaterials, 102009 Computer simulation
- Keywords
- ASJC Scopus subject areas
- Chemistry(all), Materials Science(all), Biotechnology, Biomaterials
- Portal url
- https://ucris.univie.ac.at/portal/en/publications/interferometric-4dstem-for-lattice-distortion-and-interlayer-spacing-measurements-of-bilayer-and-trilayer-2d-materials(8684829d-4d4c-4031-ac51-fa95d2dd4240).html