Direct visualization of the 3D structure of silicon impurities in graphene

Author(s)
Christoph Hofer, Viera Skakalova, Mohammad R.A. Monazam, Clemens Mangler, Jani Kotakoski, Toma Susi, Jannik C. Meyer
Abstract

We directly visualize the three-dimensional (3D) geometry and dynamics of silicon impurities in graphene as well as their dynamics by aberration-corrected scanning transmission electron microscopy. By acquiring images when the sample is tilted, we show that an asymmetry of the atomic position of the heteroatom in the projection reveals the non-planarity of the structure. From a sequence of images, we further demonstrate that the Si atom switches between up- and down- configurations with respect to the graphene plane, with an asymmetric cross-section. We further analyze the 3D structure and dynamics of a silicon tetramer in graphene. Our results clarify the out-of-plane structure of impurities in graphene by direct experimental observation and open a route to study their dynamics in three dimensions.

Organisation(s)
Physics of Nanostructured Materials
Journal
Applied Physics Letters
Volume
114
No. of pages
5
ISSN
0003-6951
Publication date
02-2019
Publication status
Published
Peer reviewed
Yes
Austrian Fields of Science 2012
103042 Electron microscopy, 103018 Materials physics, 210004 Nanomaterials, 102009 Computer simulation
ASJC Scopus subject areas
Physics and Astronomy (miscellaneous)
Electronic versions
https://arxiv.org/abs/1809.08946
Portal url
https://ucris.univie.ac.at/portal/en/publications/direct-visualization-of-the-3d-structure-of-silicon-impurities-in-graphene(62d81fa5-735b-4ac9-b78a-3f08c2dd69c9).html