Manipulating low-dimensional materials down to the level of single atoms with electron irradiation

Author(s)
Toma Susi, Jannik C. Meyer, Jani Kotakoski
Abstract

Recent advances in scanning transmission electron microscopy (STEM) instrumentation have made it possible to focus electron beams with sub-atomic precision and to identify the chemical structure of materials at the level of individual atoms. Here we discuss the dynamics that are observed in the structure of low-dimensional materials under electron irradiation, and the potential use of electron beams for single-atom manipulation. As a demonstration of the latter capability, we show how momentum transfer from the electrons of a 60-keV Ångström-sized STEM probe can be used to move silicon atoms embedded in the graphene lattice with atomic precision.

Organisation(s)
Physics of Nanostructured Materials
Journal
Ultramicroscopy
Volume
180
Pages
163-172
No. of pages
10
ISSN
0304-3991
Publication date
03-2017
Publication status
E-pub ahead of print
Peer reviewed
Yes
Austrian Fields of Science 2012
103018 Materials physics, 210004 Nanomaterials, 210006 Nanotechnology, 103042 Electron microscopy
Keywords
2D materials, Electron irradiation effects, Scanning transmission electron microscopy, Single atom manipulation
ASJC Scopus subject areas
Electronic, Optical and Magnetic Materials, Atomic and Molecular Physics, and Optics, Instrumentation
Electronic versions
https://arxiv.org/abs/1703.02429
Portal url
https://ucris.univie.ac.at/portal/en/publications/manipulating-lowdimensional-materials-down-to-the-level-of-single-atoms-with-electron-irradiation(007a10cc-ce90-4d97-8401-7a2f5cdef517).html