Amorphous structures are of academic and technical interest due to remarkable physical properties. In particular metallic glasses attracted attention in the last decades due to their high strength and hardness, connected with their deformation mechanisms. By definition, an amorphous solid does not show long range order which is typically analyzed using conventional transmission electron microscopy (TEM). In collaboration, I developed a correlative microscopy approach using high-angle annular dark field (HAADF) and electron energy loss spectroscopy (EELS) to quantify density changes within an amorphous phase. In this talk, the sensitivity and limitations of currently applied TEM based methods and their results are discussed with the help of image simulations. A custom built GPU-supported code was applied. TEM is an excellent tool to detect density changes and structural changes, occurring upon deformation and relaxation. This facilitates to study the difference between differently processed amorphous phases.