Atom-by-atom chemical identification from scanning transmission electron microscopy images in presence of noise and residual aberrations
- Author(s)
- Christoph Hofer, Viera Skákalová, Jonas Haas, Xiao Wang, Kai Braun, Robert S. Pennington, Jannik C. Meyer
- Organisation(s)
- Physics of Nanostructured Materials
- External organisation(s)
- Eberhard Karls Universität Tübingen, Hunan University
- Journal
- Ultramicroscopy
- Volume
- 227
- No. of pages
- 11
- ISSN
- 0304-3991
- DOI
- https://doi.org/10.1016/j.ultramic.2021.113292
- Publication date
- 08-2021
- Peer reviewed
- Yes
- Austrian Fields of Science 2012
- 103042 Electron microscopy, 103018 Materials physics
- Keywords
- ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials, Atomic and Molecular Physics, and Optics, Instrumentation
- Portal url
- https://ucris.univie.ac.at/portal/en/publications/atombyatom-chemical-identification-from-scanning-transmission-electron-microscopy-images-in-presence-of-noise-and-residual-aberrations(e737b406-64cd-4eec-b825-17955e6b74c2).html