Coherent x-ray diffraction imaging of grown-in antiphase boundaries in Fe<sub>65</sub> Al<sub>35</sub>

Author(s)
Lorenz-Mathias Stadler, Ross Harder, Ian K. Robinson, Christian Rentenberger, Hans-Peter Karnthaler, Bogdan Sepiol, Gero Vogl
Abstract

Coherent x-ray diffraction has been used to image grown-in antiphase boundaries (APB's) in a metal alloy, which represent pure phase objects. The fine structure within the (001) superstructure diffraction peak of a B2 -ordered bulk Fe65 Al35 sample was inverted by means of iterative algorithms that Fourier transform between reciprocal and real space, applying appropriate constraints in each domain. Since the sample object is noncompact, bigger than the beam footprint, knowing the precise beam profile was essential to define the real-space constraint. Even though a unique long-range structure could not be derived, the algorithm found phase structures that were locally unique. These were identified in all reconstruction runs by means of a cross-correlation analysis. The obtained characteristic APB morphology is confirmed by transmission electron microscopy results from the same sample, revealing nearly planar APB walls on {110} planes terminating at grown-in dislocations. © 2007 The American Physical Society.

Organisation(s)
Dynamics of Condensed Systems, Physics of Nanostructured Materials
External organisation(s)
Illinois State University
Journal
Physical Review B
Volume
76
No. of pages
9
ISSN
1098-0121
DOI
https://doi.org/10.1103/PhysRevB.76.014204
Publication date
2007
Peer reviewed
Yes
Austrian Fields of Science 2012
103015 Condensed matter
Portal url
https://ucris.univie.ac.at/portal/en/publications/coherent-xray-diffraction-imaging-of-grownin-antiphase-boundaries-in-fe65-al35(cce17bad-3ecb-48e0-99a1-9f45d8e6d375).html