Synchrotron X-ray line profile analysis experiments for the in-situ microstructural characterisation of SPD nanometals during tensile deformation

Author(s)
Michael B Kerber, Erhard Schafler, Arkadiusz K Wieczorek, Gabor Ribarik, Sigrid Bernstorff, Tamas Ungar, Michael Zehetbauer
Organisation(s)
Physics of Nanostructured Materials
External organisation(s)
Eötvös Loránd University Budapest, Elettra-Sincrotrone Trieste S.C.p.A.
Journal
International Journal of Materials Research
Volume
100
Pages
770-774
No. of pages
5
ISSN
1862-5282
DOI
https://doi.org/10.3139/146.110097
Publication date
2009
Peer reviewed
Yes
Austrian Fields of Science 2012
103023 Polymer physics, 210006 Nanotechnology, 103018 Materials physics
Portal url
https://ucris.univie.ac.at/portal/en/publications/synchrotron-xray-line-profile-analysis-experiments-for-the-insitu-microstructural-characterisation-of-spd-nanometals-during-tensile-deformation(c833a68a-4329-4eea-8792-d1597d2265f4).html