Analysis of Point Defects in Graphene Using Low Dose Scanning Transmission Electron Microscopy Imaging and Maximum Likelihood Reconstruction
- Author(s)
- Christian Kramberger, Andreas Mittelberger, Christoph Hofer, Jannik C. Meyer
- Organisation(s)
- Physics of Nanostructured Materials
- Journal
- Physica Status Solidi. B: Basic Research
- Volume
- 254
- No. of pages
- 6
- ISSN
- 0370-1972
- DOI
- https://doi.org/10.1002/pssb.201700176
- Publication date
- 11-2017
- Peer reviewed
- Yes
- Austrian Fields of Science 2012
- 103042 Electron microscopy, 103018 Materials physics
- Keywords
- ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials, Condensed Matter Physics
- Portal url
- https://ucris.univie.ac.at/portal/en/publications/analysis-of-point-defects-in-graphene-using-low-dose-scanning-transmission-electron-microscopy-imaging-and-maximum-likelihood-reconstruction(5efc652f-8646-4b89-accb-99da8785698a).html