Analysis of Point Defects in Graphene Using Low Dose Scanning Transmission Electron Microscopy Imaging and Maximum Likelihood Reconstruction

Author(s)
Christian Kramberger, Andreas Mittelberger, Christoph Hofer, Jannik C. Meyer
Organisation(s)
Physics of Nanostructured Materials
Journal
Physica Status Solidi. B: Basic Research
Volume
254
No. of pages
6
ISSN
0370-1972
DOI
https://doi.org/10.1002/pssb.201700176
Publication date
11-2017
Publication status
Published
Peer reviewed
Yes
Austrian Fields of Science 2012
103018 Materials physics, 103042 Electron microscopy
Keywords
graphene, point defects, scanning transmission electron microscopy, ATOMIC-RESOLUTION, RADIATION-DAMAGE, EXPOSURES
Portal url
https://ucris.univie.ac.at/portal/en/publications/analysis-of-point-defects-in-graphene-using-low-dose-scanning-transmission-electron-microscopy-imaging-and-maximum-likelihood-reconstruction(5efc652f-8646-4b89-accb-99da8785698a).html