Analysis of Point Defects in Graphene Using Low Dose Scanning Transmission Electron Microscopy Imaging and Maximum Likelihood Reconstruction

Author(s)
Christian Kramberger, Andreas Mittelberger, Christoph Hofer, Jannik C. Meyer
Abstract

Freestanding graphene displays an outstanding resilience to electron irradiation at low electron energies. Point defects in graphene are, however, subject to beam driven dynamics. This means that high resolution micrographs of point defects, which usually require a high electron irradiation dose might not represent the intrinsic defect population. Here, we capture the initial defects formed by ejecting carbon atoms under electron irradiation, by imaging with very low doses and subsequent reconstruction of the frequently occuring defects via a maximum likelihood algorithm.

Organisation(s)
Physics of Nanostructured Materials
Journal
Physica Status Solidi. B: Basic Research
Volume
254
No. of pages
6
ISSN
0370-1972
DOI
https://doi.org/10.1002/pssb.201700176
Publication date
11-2017
Peer reviewed
Yes
Austrian Fields of Science 2012
Materials physics, Electron microscopy
Keywords
Portal url
https://ucris.univie.ac.at/portal/en/publications/analysis-of-point-defects-in-graphene-using-low-dose-scanning-transmission-electron-microscopy-imaging-and-maximum-likelihood-reconstruction(5efc652f-8646-4b89-accb-99da8785698a).html