Quantitative local profile analysis of nanomaterials by electron diffraction
- Author(s)
- Christoph Gammer, Clemens Mangler, Christian Rentenberger, Hans-Peter Karnthaler
- Abstract
A method yielding a quantitative profile analysis from electron diffraction is worked out and combined with the local information gained from transmission electron microscopy images; it is applicable to various nanomaterials. As an example, small nanocrystalline regions are analyzed that form in FeAl by severe plastic deformation. The result is unexpected as the coherently scattering domain size does not change as a function of strain. At high strains, the sample is homogeneously nanocrystalline and the results agree well with those of X-ray diffraction.
- Organisation(s)
- Physics of Nanostructured Materials
- Journal
- Scripta Materialia
- Volume
- 63
- Pages
- 312-315
- No. of pages
- 4
- ISSN
- 1359-6462
- DOI
- https://doi.org/10.1016/j.scriptamat.2010.04.019
- Publication date
- 2010
- Peer reviewed
- Yes
- Austrian Fields of Science 2012
- 103023 Polymer physics, 210006 Nanotechnology, 103018 Materials physics
- Portal url
- https://ucris.univie.ac.at/portal/en/publications/quantitative-local-profile-analysis-of-nanomaterials-by-electron-diffraction(32368b5b-9a88-4ba5-bb7f-82927b39c73d).html