Nion UltraSTEM 100

Aberration-corrected scanning transmission electron microscope with ultra-high vacuum conditions at the sample. The minimum probe size is 1.0 Ångström and operating energies range from 20 to 100kV. The microscope column has been modified to allow sample transfer directly from the connected ultra high vacuum system, introduction of gases directly into the objective area for in situ microscopy in controlled atmospheres and a view port that allows direct line of sight to the sample during imaging.