Dual-probe STM/AFM system

This special-built device houses two scanned probe microscopes (1xSTM, 1xSTM/AFM) that face a sample from opposing sides. In this way, a thin membrane (e.g. graphene) can be probed simultaneously via two STM tips, or via STM+AFM, on the upper and lower side. It provides numerous new ways for studying thin membranes and 2D materials. The instrument is built into an ultra-high vacuum chamber in order to minimize surface adsorbates.

LVEM5 Benchtop Electron Microscope

Low voltage (5kV) benchtop electron microscope with SEM , TEM, STEM as well as ED (electron diffraction) modes. An optical microscope is integrated in the design.