Novel microscopy techniques and instrumentation

Modern microscopy techniques such as 4D-STEM combined with machine-learning enable deeper understanding of materials properties.

Advanced new techniques including 4D-STEM electron ptychography allow accessing material properties beyond the location of the atomic nuclei. In addition, computer control allows automated imaging leading to an unbiased understanding of the imaged materials at mesoscopic length scales, enabled by machine-learning-based image analysis.

PIs: Jani Kotakoski; Toma Susi

Projects:

Vienna Microscopy for Quantum Materials (VMQM)
High Definition Electron Microscopy (HDEM)

Publications:

Schloz et al., Sci. Rep. 13, 8732 (2023)
Trentino et al., Nano Lett. 21, 5179-5185 (2021)
Zachmann et al., Small 17 (28), 2100388 (2021)

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