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Nion UltraSTEM 100

Aberration-corrected scanning transmission electron microscope with ultra-high vacuum conditions at the sample. The minimum probe size is 1.0 Angstrom and operating energies range from 20 to 100kV.

Dual-probe STM/AFM system

This special-built device houses two scanned probe microscopes (1xSTM, 1xSTM/AFM) that face a sample from opposing sides. In this way, a thin membrane (e.g. graphene) can be probed simultaneously via two STM tips, or via STM+AFM, on the upper and lower side. It provides numerous new ways for studying thin membranes and 2D materials. The instrument is built into an ultra-high vacuum chamber in order to minimize surface adsorbates.

Variable temperature STM and AFM system

This machine is based on a commercial single chamber ultra-high vacuum (UHV) STM and AFM system set up in 2003 and is continuously growing since then. It now houses the microscope head connected to a flow cryostat, a scanning ion source for sample and tunneling tip cleaning or ion irradiation experiments, a mass spectrometer for precise determination of the vacuum composition (at typically 10-10 mbar) and a high sensitivity Augerelectron spectrometer for chemical surface analysis down to a percent of a monolayer.

The microscope operates between 50 and 1000 K depending on the sample type and can image all types of conducting surfaces with atomic resolution (in STM mode).

 

LVEM5 Benchtop Electron Microscope

Low voltage (5kV) benchtop electron microscope with SEM , TEM, STEM as well as ED (electron diffraction) modes. An optical microscope is integrated in the design.

Research Group Physics of Nanostructured Materials
Faculty of Physics

University of Vienna
Boltzmanngasse 5
A-1090 Vienna
T: +43-1-4277-72802
F: +43-1-4277-872802
E-Mail
University of Vienna | Universitätsring 1 | 1010 Vienna | T +43-1-4277-0