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Revealing anelasticity and structural rearrangements in nanoscale metallic glass films using in situ TEM diffraction

Authors/others:Sarkar, Rohit (Arizona State University) Ebner, ChristianIzadi, Ehsan (Arizona State University) Rentenberger, ChristianRajagopalan, Jagannathan (Arizona State University)
Abstract:We used a novel diffraction-based method to extract the local, atomic-level elastic strain in nanoscale amorphous TiAl films during in situ transmission electron microscopy deformation, while simultaneously measuring the macroscopic strain. The complementary strain measurements revealedsignificant anelastic deformation, which was independently confirmed by strain rate experiments. Furthermore, the distribution of first nearest-neighbor distances became narrower during loading and permanent changes were observed in the atomic structure upon unloading, even in the absence of macroscopic plasticity. The results demonstrate the capability of in situ electron diffraction to probe structural rearrangements and decouple elastic and anelastic deformation in metallic glasses.
Language:English
Number of pages:9
Date of publication:2017
Journal title:Materials research letters
Volume:5
Number:3
Pages:135-143
Links:
Digital Object Identifier (DOI):http://dx.doi.org/10.1080/21663831.2016.1228709
Publication Type:Article
Research Group Physics of Nanostructured Materials
Faculty of Physics

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