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Manipulating low-dimensional materials down to the level of single atoms with electron irradiation

Authors/others:Susi, TomaMeyer, Jannik C.Kotakoski, Jani

Recent advances in scanning transmission electron microscopy (STEM) instrumentation have made it possible to focus electron beams with sub-atomic precision and to identify the chemical structure of materials at the level of individual atoms. Here we discuss the dynamics that are observed in the structure of low-dimensional materials under electron irradiation, and the potential use of electron beams for single-atom manipulation. As a demonstration of the latter capability, we show how momentum transfer from the electrons of a 60-keV Ångström-sized STEM probe can be used to move silicon atoms embedded in the graphene lattice with atomic precision.

Number of pages:10
Date of publication:9.2017
Journal title:Ultramicroscopy
Digital Object Identifier (DOI):http://dx.doi.org/10.1016/j.ultramic.2017.03.005
Publication Type:Article
Research Group Physics of Nanostructured Materials
Faculty of Physics

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