Logo der Universität Wien

Articles (u:cris)

Sort by: Date | Author | Title

Khatibi, G, Wroczewski, W, Weiss, B & Licht, T 2008, 'A Fast Mechanical Test Technique for Lifetime Estimation of Microjoints' Microelectronics Reliability, vol 48, no. 11-12, pp. 1822-1830. DOI: 10.1016/j.microrel.2008.09.003
more...
Rafiee, P & Khatibi, G 2014, 'A fast reliability assessment method for Si MEMS based microcantilever beams' Microelectronics Reliability, vol 54, no. 9-10, pp. 2180-2184. DOI: 10.1016/j.microrel.2014.07.107
more...
Czerny, B, Khatibi, G, Weiss, B & Licht, T 2010, 'A fast test technique for life time estimation of ultrasonically welded Cu-Cu interconnects' Microelectronics Reliability, vol 50, no. 9.11, pp. 1641-1644. DOI: 10.1016/j.microrel.2010.07.130
more...
Wroczewski, W, Khatibi, G, Weiss, B & Licht, T 2009, 'A highly accelerated mechanical test technique for life time assessement of micro-joints' InFocus - Optical Measurement Solutions, no. 2.
more...
Eder, F, Kotakoski, J, Kaiser, U & Meyer, JC 2014, 'A journey from order to disorder - Atom by atom transformation from graphene to a 2D carbon glass' Scientific Reports, vol 4, 4060. DOI: 10.1038/srep04060
more...
Khatibi, G, Weiss, B & Betzwar-Kotas, A 2013, A Mechanical testing procedure for electronic components, Patent No. N. 10 2013 109 504.6.
more...
Khatibi, G, Wroczewski, W, Weiss, B & Ipser, H 2009, 'A new accelerated fatigue test for the study of the mechanical reliability of solder ball bonds' Micromaterials and Nanomaterials: a publication series of the Micro Materials Center Berlin at the Fraunhofer Institute IZM, vol 9.
more...
Khatibi, G, Lederer, M, Czerny, B, Betzwar-Kotas, A & Weiss, B 2014, A New Approach for Evaluation of Fatigue Life of Al Wire Bonds in Power Electronics. in J Grandfield (ed.), Light Metals 2014. John Wiley & Sons, Inc., pp. 271-277, TMS 2014 143rd ANNUAL MEETING & EXHIBITION, San Diego, United States, 16-20 February. DOI: 10.1002/9781118888438.ch47
more...
Petersmann, M, Antretter, T, Waitz, T & Fischer, FD 2017, 'A new approach predicting the evolution of laminated nanostructures - Martensite in NiTi as an example' Modelling and Simulation in Materials Science and Engineering, vol 25, no. 3, 035004. DOI: 10.1088/1361-651X/aa5ab4
more...
Argentero, G, Mustonen, K, Mirzayev, R, Mittelberger, A, Susi, T, Leuthner, GT, Cao, Y, Monazam, MRA, Pennycook, TJ, Mangler, C, Kramberger, C, Geim, AK, Kotakoski, J & Meyer, JC 2017, 'A new detection scheme for van der Waals heterostructures, imaging individual fullerenes between graphene sheets, and controlling the vacuum in scanning transmission electron microscopy' Microscopy and Microanalysis, vol 23, no. S1, pp. 460-461. DOI: 10.1017/S1431927617002987
more...
Rogl, G, Grytsiv, A, Rogl, PF, Bauer, E & Zehetbauer, M 2011, 'A new generation of p-type didymium skutterudites with high ZT' Intermetallics, vol 19, no. 4, pp. 546-555. DOI: 10.1016/j.intermet.2010.12.001
more...
Khatibi, G, Wroczewski, W, Weiss, B & Ipser, H 2009, 'A novel accelerated test technique for assessement of mechanical reliability of solder interconnects' Microelectronics Reliability, vol 49, no. 9-11, pp. 1283-1297. DOI: 10.1016/j.microrel.2009.06.021
more...
Khatibi, G, Lederer, M, Czerny, B, Betzwar-Kotas, A & Weiss, B 2014, A Novel Experimental and Numerical Approach for Lifetime Assessment of Microelectronic Devices. in B Michel (ed.), Smart System Integration for Micro- and Nanotechnologies: Honorary volume on the occasion of Thomas Gessner's 60th birthday. Goldenbogen, pp. 445-452.
more...
Rafiee, P, Khatibi, G & Zehetbauer, M 2017, 'A review of the most important failure, reliability and nonlinearity aspects in the development of microelectromechanical systems (MEMS)' Microelectronics International, vol 34, no. 1, pp. 9-21. DOI: 10.1108/MI-03-2015-0026
more...
Romanyuk, O, Supplie, O, Susi, T, May, MM & Hannappel, T 2016, 'Ab initio density functional theory study on the atomic and electronic structure of GaP/Si(001) heterointerfaces' Physical Review B (Condensed Matter and Materials Physics), vol 94, no. 15, 155309. DOI: 10.1103/PhysRevB.94.155309
more...
Oberdorfer, B, Lorenzoni, B, Unger, K, Sprengel, W, Zehetbauer, M, Pippan, R & Würschum, R 2010, 'Absolute concentration of free volume-type defects in ultrafine-grained Fe prepared by high-pressure torsion' Scripta Materialia, vol 63, no. 4, pp. 452-455. DOI: 10.1016/j.scriptamat.2010.05.007
more...
Lassnig, A, Trasischker, W, Khatibi, G, Weiss, B, Nelhiebel, M & Pelzer, R 2013, 'Accelerated lifetime estimation of thermosonic Cu ball bonds on Al metallization' Microelectronic Engineering, vol 106, pp. 188-194. DOI: 10.1016/j.mee.2013.02.015
more...
Lassnig, A, Pelzer, R, Khatibi, G, Weiss, B & Nelhiebel, M 2012, Accelerated Lifetime Measurements of Cu-Al Ball Bonded Interconnects. in 13th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) IEEE Components. Institute of Electrical and Electronics Engineers ( IEEE ), Piscataway, NJ, pp. 1-5, EURO SimE 2012, Cascais, Portugal, 16-18 April. DOI: 10.1109/ESimE.2012.6191732
more...
Khatibi, G, Lederer, M, Weiss, B, Licht, T, Bernardi, J & Danninger, H 2010, Accelerated mechanical fatigue testing and lifetime of interconnects in microelectronics. in Fatigue 2010. Procedia Engineering, no. 1, vol. 2, Elsevier BV, North-Holland, pp. 511-519. DOI: 10.1016/j.proeng.2010.03.055
more...
Meyer, JC, Eder, F, Kurasch, S, Skakalova, V, Kotakoski, J, Park, HJ, Roth, S, Chuvilin, A, Eyhusen, S, Benner, G, Krasheninnikov, A & Kaiser, U 2012, 'Accurate Measurement of Electron Beam Induced Displacement Cross Sections for Single-Layer Graphene' Physical Review Letters, vol 108, no. 19, 196102. DOI: 10.1103/PhysRevLett.108.196102
more...
Meyer, JC, Eder, F, Kurasch, S, Skakalova, V, Kotakoski, J, Park, HJ, Roth, S, Chuvilin, A, Eyhusen, S, Benner, G, Krasheninnikov, A & Kaiser, U 2013, 'Accurate Measurement of Electron Beam Induced Displacement Cross Sections for Single-Layer Graphene (vol 108, 196102, 2012)' Physical Review Letters, vol 110, no. 23, 239902. DOI: 10.1103/PhysRevLett.110.239902
more...
Setman, D, Kerber, MB, Schafler, E & Zehetbauer, M 2010, 'Activation Enthalpies of Deformation-Induced Lattice Defects in Severe Plastic Deformation Nanometals Measured by Differential Scannning Calorimetry' Metallurgical and Materials Transactions A - Physical Metallurgy and Materials Science, vol 41, no. 4, pp. 810-815. DOI: 10.1007/s11661-009-0058-0
more...
Czerny, B & Khatibi, G 2013, Advanced failure analysis of electronic systems using a 3D laser Doppler vibrometer. in W Weilinger (ed.), 3. Tagung Innovation Messtechnik: Neuheiten in der Sensorwelt und in der Messelektronik sowie deren Anwendungsgebiete. 1. edn, Shaker Verlag GmbH, pp. 35-39, Wien, Austria, 14-14 May.
more...
Stickler, C, Melisova, D, Mingler, B, Weiss, B & Stickler, R 2001, 'Advances in microstructural investigation using the REM-ECC-imaging technique' Praktische Metallographie = Practical metallography, vol 38, no. 1, pp. 19-30.
more...
Brand, C, Sclafani, M, Knobloch, C, Lilach, Y, Juffmann, T, Kotakoski, J, Mangler, C, Winter, A, Turchanin, A, Meyer, J, Cheshnovsky, O & Arndt, M 2015, 'An atomically thin matter-wave beamsplitter' Nature Nanotechnology, vol 10, pp. 845–848. DOI: 10.1038/nnano.2015.179
more...
Petersmann, M, Pranger, W, Waitz, T & Antretter, T 2017, 'An Energy Approach to Determine the Martensite Morphology in Nanocrystalline NiTi' Advanced Engineering Materials, vol 19, no. 4, 1600684. DOI: 10.1002/adem.201600684
more...
Ress, W, Khatibi, G, Weiss, B & Groeger, V 2012, An ultrafast mechanical test system for bending fatigue studies of multilayered electronic components. in 2012 4th Electronic System-Integration Technology Conference (ESTC). IEEE Computer Society, NEW YORK, 4th Electronic System-Integration Technology Conference (ESTC), Amsterdam, Netherlands, 17-20 September. DOI: 10.1109/ESTC.2012.6542197
more...
Marczewska-Lasa, B, Zehetbauer, M, Pfeiler, W & Wielke, B 1991, 'Analysis of isothermal and isochronal annealing in deformed Zn and Zn-Ag' Journal of Materials Science, vol 26, no. 16, pp. 4499-4510. DOI: 10.1007/BF00543673
more...
Ghomsheh, MZ, Spieckermann, F, Polt, G, Wilhelm, H & Zehetbauer, M 2015, 'Analysis of strain bursts during nanoindentation creep of high-density polyethylene' Polymer international, vol 64, no. 11, pp. 1537-1543. DOI: 10.1002/pi.4967
more...
Sohar, C, Betzwar-Kotas, A, Gierl, C, Weiss, B & Danninger, H 2008, 'Anisotropy effects on gigacycle fatigue behaviour of high Cr alloyed cold work tool steel' Kovove Materialy - Metallic Materials, vol 46, no. 4, pp. 197-207.
more...
Mikulowski, B, Gröger, V & Krexner, G 2000, 'Annealing characteristics of supersaturated vacancies in copper and nickel (Article) [Charakterystyki wyżarzania miedzi oraz niklu przesyconych wakancjami]' Archives of Metallurgy and Materials, vol 45, no. 3, pp. 237-245.
more...
Sarkar, R, Rentenberger, C & Rajagopalan, J 2016, 'Anomalous beam effects during in situ transmission electron microscopy deformation of nanocrystalline and ultrafine-grained metals' Microscopy and Microanalysis, vol 22, no. S3, pp. 1498-1499. DOI: 10.1017/S1431927616008333
more...
Sato-Turtelli, R, Bormio-Nunes, C, Tiguman, KT, Geist, D, Panigrahi, A, Grijalva, C, Sorta, S, Groessinger, R & Zehetbauer, M 2014, 'Antiferromagnetism and Low Magnetostriction in Fe100-xMnx (x=38, 42, 46, 50, and 55) Alloys' IEEE Transactions on Magnetics, vol 50, no. 4, 2004604. DOI: 10.1109/TMAG.2013.2285439
more...
Horky, J, Lederer, M, Weiss, B, Zehetbauer, M & Zagar, BG 2011, Application of a locally operating laser-speckle strain sensor on tensile deformation of miniaturized nanostructured specimens. in Proceedings of the 20th IMEKO TC2 Symposium on Photonics in Measurement: May 16-18, 2011 Linz Austria. Shaker, pp. 101-103.
more...
Khatibi, G, Lederer, M, Lassnig, A & Weiss, B 2013, Application of accelerated mechanical test techniques for evaluation of microelectronic components. in Micromaterials and Nanomaterials. vol. 15, pp. 158-162, Leipzig, Germany, 25-26 February.
more...
Spieckermann, F, Wilhelm, H, Schafler, E, Ahzi, S & Zehetbauer, M 2008, 'Application of composite models to isotactic polypropylene for the determination of phase specific stress-strain curves' Materials Science and Engineering A: Structural Materials: Properties, Microstructures and Processing, vol 483-484, no. SI, pp. 76-78. DOI: 10.1016/j.msea.2006.10.180
more...
Rafiee, P, Khatibi, G, Nelhiebel, N & Pelzer, R 2013, 'Application of quantitative modal analysis for investigation of thermal degradation of microelectronic packages' Microelectronics Reliability, vol 53, no. 9-11, pp. 1563-1567. DOI: 10.1016/j.microrel.2013.07.028
more...
Magnien, J & Khatibi, G 2014, 'Assessment of Mechanical Reliability of Surface Mounted Capacitor by an Accelerated Shear Fatigue Test Technique' Microelectronics Reliability, vol 54, no. 9-10, pp. 1764-1769. DOI: 10.1016/j.microrel.2014.07.064
more...
Kurasch, S, Kotakoski, J, Lehtinen, O, Skakalova, V, Smet, JH, Krill, CE, Krasheninnikov, A & Kaiser, U 2012, 'Atom-by-Atom Observation of Grain Boundary Migration in Graphene' Nano Letters: a journal dedicated to nanoscience and nanotechnology, vol 12, no. 6, pp. 3168-3173. DOI: 10.1021/nl301141g
more...
Ramasse, QM, Kepapstoglou, DM, Hage, FS, Susi, T, Kotakoski, J, Mangler, C, Ayala, P, Meyer, J, Hinks, JA, Donnelly, S, Zan, R, Pan, CT, Haigh, SJ & Bangert, U 2014, 'Atom-by-atom STEM investigation of defect engineering in graphene' Microscopy and Microanalysis, vol 20, no. 3, pp. 1736-1737. DOI: 10.1017/S1431927614010411
more...
Schöck, G 2010, 'Atomic dislocation core parameters' Physica Status Solidi. B: Basic Research, vol 247, no. 2, pp. 265-268. DOI: 10.1002/pssb.200945379
more...
Provine, J, Schindler, P, Torgersen, J, Kim, HJ, Karnthaler, H-P & Prinz, FB 2016, 'Atomic layer deposition by reaction of molecular oxygen with tetrakisdimethylamido-metal precursors' Journal of vacuum science & technology a, vol 34, no. 1, 01A138. DOI: 10.1116/1.4937991
more...
Kotakoski, J, Eder, FR & Meyer, JC 2014, 'Atomic structure and energetics of large vacancies in graphene' Physical Review B (Condensed Matter and Materials Physics), vol 89, no. 20, 201406. DOI: 10.1103/PhysRevB.89.201406
more...
S.J. Pennycook; G. Duscher; R. Buczko; M. Kim; N.D. Browning; W. Zhou; R. Ishikawa; S.T. Pantelides, Li, C & Pennycook, T 2015, 'Atomic Structure and Properties of Dislocations and Grain Boundaries' Reference Module in Materials Science and Materials Engineering. DOI: 10.1016/B978-0-12-803581-8.02927-1
more...
Meyer, JC, Kotakoski, J & Mangler, C 2014, 'Atomic structure from large-area, low-dose exposures of materials: A new route to circumvent radiation damage: A new route to circumvent radiation damage' Ultramicroscopy, vol 145, pp. 13-21. DOI: 10.1016/j.ultramic.2013.11.010
more...
Kotakoski, J, Eder, F, Argentero, G, Hummel, S, Lindner, D & Meyer, J 2015, 'Atomic Structure of Amorphous 2D Carbon Structures as Revealed by Scanning Transmission Electron Microscopy' Microscopy and Microanalysis, vol 21, no. S3, pp. 997-998. DOI: 10.1017/S1431927615005784
more...
Holmström, E, Kotakoski, J, Lechner, L, Kaiser, U & Nordlund, K 2012, 'Atomic-scale effects behind structural instabilities in Si lamellae during ion beam thinning' AIP Advances, vol 2, no. 1, 12186. DOI: 10.1063/1.3698411
more...
Susi, T, Kotakoski, J, Arenal, R, Kurasch, S, Jiang, H, Skakalova, V, Stephan, O, Krasheninnikov, A, Kauppinen, E, Kaiser, U & Meyer, JC 2012, 'Atomistic Description of Electron Beam Damage in Nitrogen-Doped Graphene and Single-Walled Carbon Nanotubes' ACS Nano, vol 6, no. 10, pp. 8837-8846. DOI: 10.1021/nn303944f
more...
Susi, T, Kotakoski, J, Arenal, R, Kurasch, S, Jiang, H, Skakalova, V, Stephan, O, Krasheninnikov, A, Kauppinen, E, Kaiser, U & Meyer, JC 2013, 'Atomistic Description of Electron Beam Damage in Nitrogen-Doped Graphene and Single-Walled Carbon Nanotubes (vol 6, pg 8837, 2012)' ACS Nano, vol 7, no. 8, pp. 7436-7436. DOI: 10.1021/nn4034629
more...
Mittelberger, A, Kramberger, C, Hofer, C, Mangler, C & Meyer, JC 2017, 'Automated Image Acquisition for Low-Dose STEM at Atomic Resolution' Microscopy and Microanalysis, vol 23, no. 4, pp. 809-817. DOI: 10.1017/S1431927617000575
more...

Research Group Physics of Nanostructured Materials
Faculty of Physics

University of Vienna
Boltzmanngasse 5
A-1090 Vienna
T: +43-1-4277-72802
F: +43-1-4277-872802
E-Mail
University of Vienna | Universitätsring 1 | 1010 Vienna | T +43-1-4277-0